Prof. Jovan G. Brankov

Dr. Brankov is a Professor in ECE/BME Department at the Illinois Institute of Technology. His research interests include medical imaging (software and hardware), machine learning and data mining. His current research topics include: medical image quality assessment based on a human-observer model, multiple-image radiography (a new phase-sensitive x-ray imaging method), 4D and 5D tomographic image reconstruction methods for medical image sequences and deep learning in medical imaging. He established the Advanced X-ray Imaging Laboratory (AXIL) at IIT, which is currently developing a phase-sensitive x-ray device.
His is currently serving as: associate editor for IEEE Transactions on Biomedical Engineering, Medical Physics (AAPM) and Journal of Electronic Imaging (SPIE and IS&T), program committee member for IEEE International Symposium on Biomedical Imaging and SPIE Image Perception conferences and review on SBIB (10) NIH panel. He is a member of SPIE, Sigma Xi and senior member of IEEE technical communities.